The AFM-2000 is Semilab’s high-end atomic force microscope, delivering high-resolution, sub-atomic precision measurements for both academic research and semiconductor industry applications. Ideal for surface roughness and critical dimension control, it offers a large sample stage movement range of 200 × 250 mm with full automation capability—making it ideal for both R&D and industrial quality control.
• R&D: Materials science, semiconductor device research, advanced metrology
• Industrial: Surface roughness measurement, critical dimension control, nanometrology, inline process monitoring
• Process control: Wafer manufacturing, structural feature analysis, automated measurement
• Proven track record of Semilab AFM product family: Cited in multiple scientific publications
• User-friendly operation for any trained operator
• Flexible workflow control via script or recipe-based operation
• High precision sample positioning with long-range XY stage (200 × 250 mm)
• Integrated optics for visual positioning & control during scanning
• High-resolution CCD camera
• Fully automated measurements with programmable positioning and report generation
• Multiple SPM modes including tapping, contact, conductive AFM, EFM, KPFM, MFM
• Sample size: 200 mm
• Sample thickness: 60 mm
• Scan area: 200 x 250 mm
• Scanner: Planar scanner
• Software: Measurement Control & Analysis Software
