2017
Meeting Abstracts - The Electrochemical Society

Kelvin Force Probe Microscopy of Ferroelectric Si: HfO2

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Abstract

ECS Meeting Abstracts contain extended abstracts of the technical papers presented at ECS meetings and ECS-sponsored meetings. This publication offers a first look into the current research in the field. ECS Meeting Abstracts are freely available to all visitors to the ECS Digital Library.

Topic

corona - Kelvin, Non-Contact Measurement, THIN FILM CHARACTERIZATION

Author

Dmitriy Marinskiy, Patrick Polakowski, Jacek Lagowski, Marshall Wilson, Piotr Edelman, Johannes Müller

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