2013
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China SoG Silicon and PV Power Conference, June 2013, Suzhou, China

Technique for Monitoring of PID Susceptibility and Interface Trap Density in Advanced Passivation Dielectrics

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Abstract

Topic

passivation dielectric, interface trap density, PID susceptibility

Author

M. Wilson, A. Findlay, J. Lagowski, J. D’Amico, A. Savtchouk
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