New Surface Photovoltage (SPV) Method for High Precision Measurement of the Minority Carrier Diffusion Length and Surface Recombination Velocity in Silicon Wafers

Abstract

surface photovoltage, Minority Carrier Diffusion Length, surface recombination velocity, Silicon (Si)

V. Faifer, P. Edelman, A. Kontkiewicz, J. Lagowski, A. Hoff, V. Dyukov, A. Pravdivtsev, I. Kornienko

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