The present paper gives an overview of the possibilities of microwave detected photoconductivity decay technique (µ-PCD) in the field of photovoltaics with special emphasis on the practical aspects. Applications are followed all through the manufacturing process from feedstock throughout the form of ingot, block, as-cut wafer, processed wafer up to finished cell. Future chances of the technique for thin film solar cell investigations are also covered. Key problems for carrier lifetime measurements, i.e. the role of surface recombination and separate detection of iron contamination are discussed in details. Whenever relevant a comparison with standard microelectronic semiconductor applications is given. In addition to laboratory use implementations in a manufacturing environment as inline tools are also described.
