1999
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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes, Proceedings of ALTECH 99, Leuven, Belgium, Electrochemical Society Proceedings Volume 99-16, 48-55.

Lifetime Measurements in SOI and Epi Structures

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Abstract

Topic

lifetime, SOI, EPI

Author

T. Pavelka, Z. Batari
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